ALEXANDRIA, Va., July 14 -- United States Patent no. 12,682,964, issued on July 14, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).
"Apparatus and methods for hole current program verify operations" was invented by Wei Cao (Fremont, Calif.), Jiahui Yuan (Fremont, Calif.) and Xiang Yang (Santa Clara, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus is provided that includes a NAND string including a first memory cell coupled to a first word line, and a control circuit coupled to the NAND string. The control circuit is configured to apply a verify voltage to the first word line, perform a verify test on the first memory cell to sense a hole conduction current, and perform a prog...