ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,555,213, issued on Feb. 17, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).
"Modelling and prediction system with auto machine learning in the production of memory devices" was invented by Tsuyoshi Sendoda (Kuwana, Japan), Yusuke Ikawa (Yokohama, Japan), Nagarjuna Asam (Fujisawa, Japan), Kei Samura (Yokohama, Japan) and Masaaki Higashitani (Cupertino, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "To provide more test data during the manufacture of non-volatile memories and other integrated circuits, machine learning is used to generate virtual test values. Virtual test results are interpolated for one set of tests for devices on wh...