US Patent Issued to Sandisk Technologies on Aug. 26 for "Systems, devices, and methods for testing integrated circuits in their native environments" (Israeli Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,214, issued on Aug. 26, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.).

"Systems, devices, and methods for testing integrated circuits in their native environments" was invented by Nadav Tsur (Bet Herut, Israel), Avi Shani (Petach Tikva, Israel) and Yair Sommer (Even Yehuda, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed herein are unitary printed circuit boards (PCBs) and methods of using them for testing an integrated circuit (IC). In some embodiments, a unitary PCB comprises a main board portion and a flexible PCB portion, which are configured to be detached from each other at a separation location on the unitary PC...