ALEXANDRIA, Va., Feb. 17 -- United States Patent no. 12,556,380, issued on Feb. 17, was assigned to SAMSUNG SDS Co. LTD. (Seoul, South Korea).
"Method for analyzing quantum vulnerability and system therefor" was invented by Eun Kyung Kim (Seoul, South Korea), Chang Hoon Lee (Seoul, South Korea), Hyo Jin Yoon (Seoul, South Korea) and Ji Hoon Cho (Seoul, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a method for analyzing quantum vulnerability and a system therefor. The method according to some embodiments may include configuring quantum-vulnerable algorithm detection rule based on a type of encryption algorithm, configuring an analysis level for analyzing a quantum vulnerability of t...