ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,747,997, issued on Sept. 29, was assigned to Samsung SDI Co. Ltd. (Yongin-si, South Korea).
"Testing method for a thermal contact" was invented by Maximilian Hofer (Hartberg, Austria) and Helmut Hammerschmied (Graz, Austria).
According to the abstract* released by the U.S. Patent & Trademark Office: "A testing method for a thermal contact between a temperature sensor and a battery cell of a battery module, includes measuring a temperature T1 of the temperature sensor at a time point t1, heating the temperature sensor for a defined time (t2-t1) and/or (t3-t1), measuring a temperature T2 of the temperature sensor at a time point t2 and/or a temperature T3 of the temperature sensor at ...