US Patent Issued to SAMSUNG ELECTRONICS on Sept. 8 for "Wordline defect detection circuit, wordline defect detection method, and memory device including the same" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,731,654, issued on Sept. 8, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea).

"Wordline defect detection circuit, wordline defect detection method, and memory device including the same" was invented by Jayang Yoon (Suwon-si, South Korea), Seongjin Kim (Suwon-si, South Korea), Chihyun Kim (Suwon-si, South Korea), Junehong Park (Suwon-si, South Korea) and Hyeongdo Choi (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A word line defect detection circuit configured to detect a defect of at least one word line selected from a plurality of word lines of a memory device includes a current generating circuit configur...