US Patent Issued to SAMSUNG ELECTRONICS on Sept. 15 for "Scanning electron microscope image processing using neural network" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,013, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Scanning electron microscope image processing using neural network" was invented by Hojoon Lee (Suwon-si, South Korea), Seoyeon Park (Suwon-si, South Korea), Seongryeol Kim (Suwon-si, South Korea), Ilkwon Kim (Suwon-si, South Korea), Sanggul Park (Suwon-si, South Korea) and Younggu Kim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A neural network device includes: (1) a pre-processor configured to select target images from scanning electron microscope (SEM) images, based on frequencies respectively corresponding to the SEM images,...