ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,184, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Electroluminescence inspection apparatus" was invented by Changjoon Lee (Suwon-si, South Korea), Jinyoung Kim (Suwon-si, South Korea), Sungyong Min (Suwon-si, South Korea), Kyungwoon Jang (Suwon-si, South Korea), Changkyu Chung (Suwon-si, South Korea) and Daesuck Hwang (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electroluminescence inspection apparatus includes a first substrate; a plurality of electrodes provided at a first surface of the first substrate; a driving circuit provided at a second surface of the first substrate ...