ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,446, issued on Sept. 15, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea).
"Apparatus for manufacturing analytical semiconductor samples and method for manufacturing analytical semiconductor samples by using the same" was invented by Min Chul Jo (Suwon-si, South Korea), Sang Hyun Park (Suwon-si, South Korea), Su Jin Shin (Suwon-si, South Korea), Gil Ho Gu (Suwon-si, South Korea), Dae Gon Yu (Suwon-si, South Korea), So Yeon Lee (Suwon-si, South Korea) and Yun Bin Jeong (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "There is provide a method for manufacturing analytical semiconductor samples by using an a...