ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,066, issued on Sept. 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Test apparatus with test chamber for burn in boards" was invented by Dahm Yu (Suwon-si, South Korea), Dong Ho Lee (Suwon-si, South Korea), Seon Mi Lee (Suwon-si, South Korea) and Hyun-Mi Hong (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test apparatus includes a test chamber; a first rack supporting a plurality of first burn in boards stacked in a first direction; a second rack on top of the first rack, and configured to support a plurality of second burn in boards stacked in the first direction; and a supply duct on a first wall...