US Patent Issued to SAMSUNG ELECTRONICS on Sept. 1 for "Semiconductor test apparatus and power supply method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,067, issued on Sept. 1, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Semiconductor test apparatus and power supply method thereof" was invented by Ungjin Jang (Suwon-si, South Korea) and Hyucksoo Jeon (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a semiconductor test apparatus for simultaneously testing a maximum number of semiconductor chips, and a power supply method of the semiconductor test apparatus. The semiconductor test apparatus includes a tester including a power supply configured to simultaneously supply power to a plurality of devices under test (DUTs) during a test, and a te...