ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,754,090, issued on Oct. 6, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Baffle inspection apparatus" was invented by Sangjine Park (Suwon-si, South Korea), Jihwan Park (Suwon-si, South Korea) and Kuntack Lee (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A baffle inspection apparatus is provided and includes: a baffle including a spray surface configured to receive and spray fluid; an upper vessel coupled to the baffle such that the spray surface of the baffle faces downwards; an upper plate above the upper vessel and supporting the upper vessel; a lower vessel below the upper vessel and apart from the upp...