ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,173, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).
"Test device and operating method thereof" was invented by Yubin Lee (Suwon-si, South Korea), Dayun Lee (Suwon-si, South Korea), Kundong Kim (Suwon-si, South Korea) and Yongkoo Park (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system for testing whether or not an image sensor included in an image frame is defective includes including a processor configured to execute machine-readable instructions that, when executed by the processor, cause the test device to generate a test image by performing one or more preprocessing operations on...