US Patent Issued to SAMSUNG ELECTRONICS on Nov. 3 for "Semiconductor measurement device" (South Korean Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,107, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Semiconductor measurement device" was invented by Garam Choi (Suwon-si, South Korea), Wookrae Kim (Suwon-si, South Korea), Jinseob Kim (Suwon-si, South Korea), Jinyong Kim (Suwon-si, South Korea), Younguk Jin (Suwon-si, South Korea) and Charles Soon Hong Hwang (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor measurement device includes a light source configured to generate a laser beam, a polarization unit arranged on a path of the laser beam generated from the light source, and configured to separate the laser beam into ...