US Patent Issued to SAMSUNG ELECTRONICS on Nov. 3 for "Method and device with operation mode dependent defect detection" (Indian Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,784,171, issued on Nov. 3, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Method and device with operation mode dependent defect detection" was invented by Priyadarshini Panemangalore Pai (Bengaluru, India), Prashant Pandurang Shinde (Bengaluru, India) and Shashishekara Parampalli Adiga (Bengaluru, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and device with defect detection are included. In one general aspect, a method performed by an electronic device includes determining, by the electronic device, an operation mode among different operation modes, wherein the electronic device is configured to implement the ope...