US Patent Issued to SAMSUNG ELECTRONICS on May 5 for "Probe card including power compensation circuit and test system including the same" (South Korean Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,618,902, issued on May 5, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Probe card including power compensation circuit and test system including the same" was invented by Seongkwan Lee (Suwon-si, South Korea), Minho Kang (Suwon-si, South Korea), Jongpill Park (Suwon-si, South Korea), Cheolmin Park (Suwon-si, South Korea) and Jaemoo Choi (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe card includes a plurality of power lines that are electrically connected to the plurality of DUTs, a plurality of ground lines that are electrically connected to the plurality of DUTs and to each other, and a plurality o...