US Patent Issued to SAMSUNG ELECTRONICS on March 3 for "Test device and test method implementing the same" (South Korean Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,213, issued on March 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Test device and test method implementing the same" was invented by Gyuyeol Kim (Suwon-si, South Korea) and Jaewoong Choi (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device includes a tester configured to provide a plurality of electrical signals to a device under test (DUT), and a probe card removably attached to the tester, the probe card including a plurality of channels and at least one detection circuit, where each of the plurality of channels includes a path through which a respective electrical signal of the plurality...