US Patent Issued to SAMSUNG ELECTRONICS on March 3 for "Measurement apparatus and measurement method using the same" (South Korean Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,128, issued on March 3, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Measurement apparatus and measurement method using the same" was invented by Jaeho Kim (Suwon-si, South Korea), Younghoon Sohn (Suwon-si, South Korea) and Sunhong Jun (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement apparatus includes a light source assembly configured to emit light to a sample, a measuring device configured to measure reflected light, and a stage on which the sample is provided, where the light source assembly includes a first plate, a plurality of light sources connected to the first plate and a blockin...