US Patent Issued to SAMSUNG ELECTRONICS on March 17 for "Control of debug port access to data in a memory device, operating method of the same, and memory system" (South Korean Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,307, issued on March 17, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Control of debug port access to data in a memory device, operating method of the same, and memory system" was invented by Yongsuk Lee (Suwon-si, South Korea), Myeongjong Ju (Suwon-si, South Korea) and Jisoo Kim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A memory device includes one or more non-volatile memories configured to store user data and at least one key related to the user data; a network-on-chip comprising a bus manager configured to manage access to the user data and the at least one key; and a debug port directly con...