ALEXANDRIA, Va., March 17 -- United States Patent no. 12,579,346, issued on March 17, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Apparatus and method for performing collision analysis" was invented by Tianwei Xing (Santa Clara, Calif.), Wenjun Jiang (San Jose, Calif.) and Xun Chen (Fremont, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device may be provided to perform collision analysis. The electronic device may be configured to: receive sensor data from an inertial-measuring-unit (IMU) sensor; detect that a collision event has occurred based on the sensor data and detect collision data from the sensor data; input the collision data into a collision classif...