US Patent Issued to SAMSUNG ELECTRONICS on June 30 for "Defect detecting system of automotive apparatus" (South Korean Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,532, issued on June 30, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Defect detecting system of automotive apparatus" was invented by Hyun Seok Nam (Suwon-si, South Korea) and Sang Ho Kim (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detecting system of an automotive apparatus is provided. The defect detecting system includes: a digital function block including: a memory device configured to store data, and a first Built-In Self Test (BIST) configured to detect a defect of the memory device; an analog function block including a verification parity generator configured to: receive the data th...