US Patent Issued to SAMSUNG ELECTRONICS on June 2 for "Storage device for selectively performing high-reliability program operation according to temperature, and operation method of the storage device" (South Korean Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,646,568, issued on June 2, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Storage device for selectively performing high-reliability program operation according to temperature, and operation method of the storage device" was invented by Sewoong Lee (Suwon-si, South Korea), Kwangjin Lee (Suwon-si, South Korea), Kirock Kwon (Suwon-si, South Korea), Kyungduk Lee (Suwon-si, South Korea), Sangsoo Cha (Suwon-si, South Korea) and Younsoo Cheon (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided is a storage device including a memory device including a plurality of memory blocks each including a plurality of mem...