ALEXANDRIA, Va., July 21 -- United States Patent no. 12,687,489, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Probe and inspection apparatus including the same" was invented by Junbum Park (Suwon-si, South Korea), Namil Koo (Suwon-si, South Korea), Jaeho Kim (Suwon-si, South Korea), Jongsu Kim (Suwon-si, South Korea), Suhwan Park (Suwon-si, South Korea), Sangwoo Bae (Suwon-si, South Korea), Inkeun Baek (Suwon-si, South Korea), Ikseon Jeon (Suwon-si, South Korea) and Martin Priwisch (Suwon-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus is provided. The inspection apparatus includes a substrate extending in a first direction a...