US Patent Issued to SAMSUNG ELECTRONICS on July 21 for "Inter-cell beam measurement and reporting" (Texas, New Jersey Inventors)

ALEXANDRIA, Va., July 21 -- United States Patent no. 12,689,928, issued on July 21, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Inter-cell beam measurement and reporting" was invented by Emad Nader Farag (Flanders, N.J.), Eko Onggosanusi (Coppell, Texas) and Dalin Zhu (Allen, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A UE includes a transceiver configured to receive first information related to a group of CSI-RS resources, receive second information related to a group TCI states, receive third information indicating an association between the group of TCI states and the group of CSI-RS resources, receive fourth information indicating resources for transmission of a beam ...