ALEXANDRIA, Va., July 16 -- United States Patent no. 12,361,537, issued on July 15, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Electronic device including processor executing defect detection module, operating method of electronic device, and method for fabricating semiconductor integrated circuit" was invented by Min-Cheol Kang (Hwaseong-si, South Korea), Sooryong Lee (Seoul, South Korea) and Kyen-Hee Lee (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a semiconductor integrated circuit fabricating method of a semiconductor fabricating device which includes a processor executing a defect detection module includes receiving, at the defect detection ...