US Patent Issued to SAMSUNG ELECTRONICS on July 14 for "Jitter measuring circuit, jitter analyzing apparatus including the same, and related methods of manufacturing semiconductor devices" (South Korean Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,081, issued on July 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Jitter measuring circuit, jitter analyzing apparatus including the same, and related methods of manufacturing semiconductor devices" was invented by Hyeon Gwan Oh (Suwon-si, South Korea) and Beomsang Yoo (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A jitter analyzing apparatus may include a first delay circuit configured to delay a reference clock to output a first clock, a second delay circuit configured to delay the reference clock to output a second clock having a delay value greater than the first delay circuit, and a test devi...