US Patent Issued to SAMSUNG ELECTRONICS on Feb. 24 for "Polarized microscope and intra image field correction analysis method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,560,792, issued on Feb. 24, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Polarized microscope and intra image field correction analysis method" was invented by Ken Ozawa (Yokohama, Japan), Shinji Ueyama (Yokohama, Japan) and Tomoki Onishi (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The polarized microscope includes a light source configured to generate illumination light, a polarizer configured to interact with the generated illumination light to transmit rectilinear polarized light having a first orientation, an analyzer configured to transmit a component of rectilinear polarized light reflected by a sample...