US Patent Issued to SAMSUNG ELECTRONICS on Feb. 10 for "Method of testing storage controller included in storage device" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,633, issued on Feb. 10, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Method of testing storage controller included in storage device" was invented by Jongyeong Jung (Suwon-si, South Korea) and Seung-Chun Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing a storage controller included in a storage device may include supplying power to the storage device, transmitting a write command including an algorithm pattern corresponding to a designated special function register of the storage controller, transmitting a read command corresponding to the designated special function register, re...