US Patent Issued to SAMSUNG ELECTRONICS on Dec. 2 for "Computing devices for predicting electrical tests, electrical test prediction apparatuses having the same, and operating methods thereof" (South Korean Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,272, issued on Dec. 2, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea).

"Computing devices for predicting electrical tests, electrical test prediction apparatuses having the same, and operating methods thereof" was invented by Seyoung Park (Hwaseong-si, South Korea), Gwangnae Gil (Yongin-si, South Korea), Sola Woo (Suwon-si, South Korea) and Jonghyun Lee (Hwaseong-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of operating an electrical test prediction apparatus includes determining a relationship between first electrical test (ET) data, corresponding to at least one shot region comprising a subset of a p...