ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,635, issued on April 7, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).
"Black-box fuzzing testing method and apparatus" was invented by Haitao Hu (Shaanxi, China), Zhu Fu (Shaanxi, China), Huan Guo (Shaanxi, China), Hao Yan (Shaanxi, China) and Zhenan Tang (Shaanxi, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A black-box fuzzing testing method includes: generating a plurality of testcases; executing a target program based on each of the generated testcases to obtain a plurality of execution results; determining a plurality of execution paths of the target program using the execution results; and determining a code cov...