US Patent Issued to SAMSUNG ELECTRONICS on April 14 for "Image sensor including plural memory areas for storing bad pixel information and image sensor test device" (South Korean Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,604,113, issued on April 14, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea).

"Image sensor including plural memory areas for storing bad pixel information and image sensor test device" was invented by Deokha Shin (Suwon-si, South Korea) and Dahee Lee (Suwon-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An image sensor test device includes: an interface configured to transmit a control signal to an image sensor to be tested; and a host device configured to transmit, to the image sensor, a storage control signal instructing to store information about a bad pixel which is determined based on an output signal of the i...