US Patent Issued to SAMSUNG ELECTRONICS, POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION on March 17 for "Method and apparatus for detecting reflection coefficient" (South Korean Inventors)

ALEXANDRIA, Va., March 17 -- United States Patent no. 12,580,594, issued on March 17, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea) and POSTECH RESEARCH AND BUSINESS DEVELOPMENT FOUNDATION (Pohang-si, South Korea).

"Method and apparatus for detecting reflection coefficient" was invented by Hyunchul Park (Suwon-si, South Korea), Ho-Jin Song (Pohang-si, South Korea), Yonghoon Kim (Suwon-si, South Korea), Sunggi Yang (Suwon-si, South Korea), Seunguk Choi (Pohang-si, South Korea) and Seunghoon Lee (Pohang-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure relates to a 5th generation (5G) or pre-5G communication system for supporting a higher data transmission rat...