US Patent Issued to SAMSUNG ELECTRONICS, IUCF-HYU (Industry-University Cooperation Foundation Hanyang University) on Feb. 24 for "Fluorescence microscopy metrology system and method of operating fluorescence microscopy metrology system" (South Korean Inventors)

ALEXANDRIA, Va., Feb. 24 -- United States Patent no. 12,561,788, issued on Feb. 24, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Gyeonggi-do, South Korea) and IUCF-HYU (Industry-University Cooperation Foundation Hanyang University) (Seoul, South Korea).

"Fluorescence microscopy metrology system and method of operating fluorescence microscopy metrology system" was invented by Namyoon Kim (Suwon-si, South Korea), Doory Kim (Seoul, South Korea), Wookrae Kim (Suwon-si, South Korea), Myungjun Lee (Suwon-si, South Korea), Jaehwang Jung (Suwon-si, South Korea), Changhoon Choi (Suwon-si, South Korea), Dokyung Jeong (Seoul, South Korea) and Uidon Jeong (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office...