ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,106, issued on Sept. 2, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).
"Device and method for measuring thickness" was invented by Ohjune Kwon (Yongin-si, South Korea) and Jinho Hyun (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A thickness measuring device includes an imaging unit disposed above an inspection substrate, which includes a substrate, a pattern provided on the substrate, and an inspection layer disposed on the pattern. The imaging unit images the inspection substrate to output inspection image data and a data calculating unit receives the inspection image data and calculates a thickness va...