ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,770,243, issued on Oct. 20, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).
"Module and system for, and method of detecting defects in ultra-thin glass" was invented by Yunku Kang (Yongin-si, South Korea), Sungmin Park (Yongin-si, South Korea), Janghoon Lee (Yongin-si, South Korea) and Leegu Han (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic inspection system for detecting defects in ultra-thin glass is disclosed that includes an edge inspection module for inspecting for chipping and wedge defects caused during laser cutting of the ultra-thin glass into cell units, a surface inspection module for i...