ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,520, issued on March 3, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea).
"Inspection method of display apparatus" was invented by Hansu Cho (Yongin-si, South Korea), Junyoung Ko (Yongin-si, South Korea), Jinwoo Park (Yongin-si, South Korea) and Jeongheon Lee (Yongin-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection method of a display apparatus, includes: determining a reference value for sensing electrodes of the display apparatus; measuring a first capacitance corresponding to a mutual capacitance of a first sensing electrode located in a first area from among the sensing electrodes; measuring a second ...