US Patent Issued to SAMSUNG DISPLAY on July 28 for "Optical inspection system and optical inspection method" (South Korean Inventors)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,693,234, issued on July 28, was assigned to SAMSUNG DISPLAY Co. LTD. (Gyeonggi-Do, South Korea).

"Optical inspection system and optical inspection method" was invented by Inhye Park (Yongin-si, South Korea), Hyunduck Kim (Yongin-si, South Korea), Yeong-Chang Yi (Yongin-si, South Korea) and Hyeongmin Ahn (Yongin-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical inspection system includes: cameras, which capture images of partitioned areas of a substrate, respectively; inspection computers, which receive partial original images corresponding to the partitioned areas from the cameras, respectively, and transmit the partial original ...