US Patent Issued to SAKI on Oct. 27 for "Inspection device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,885, issued on Oct. 27, was assigned to SAKI Corp. (Tokyo).

"Inspection device" was invented by Hideaki Tanaka (Tokyo) and Tatsuyuki Matsuura (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection device includes: a first image unit that captures an image of an inspection object from a vertical direction; a plurality of dome-shaped reflector plates being arranged between the first image unit and the inspection object and having aperture parts on a side of the first image unit and a side of the inspection object, respectively; a plurality of annular light sources that illuminate the respective reflector plates; and apparatuses for inspec...