US Patent Issued to S.D. Sight Diagnostics on Aug. 18 for "Classification models for analyzing a sample" (Israeli Inventors)

ALEXANDRIA, Va., Aug. 18 -- United States Patent no. 12,711,788, issued on Aug. 18, was assigned to S.D. Sight Diagnostics Ltd. (Tel Aviv, Israel).

"Classification models for analyzing a sample" was invented by Amir Zait (Binyamina, Israel), Dan Gluck (Kadima, Israel), Arnon Houri Yafin (Jerusalem), David Brailovsky (Hertzliya, Israel), Yochay Shlomo Eshel (Sde Warburg, Israel), Sarah Levy (Jaffa, Israel) and Joseph Joel Pollak (Neve Daniel, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "Apparatus and methods are described including analyzing one or more microscopic images of the blood sample using a machine-learning classifier. An entity within the one or more microscopic images is identified using a...