US Patent Issued to RTX on March 24 for "Method and apparatus for machine learning based inlet debris monitoring" (Connecticut, Georgia Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,585,728, issued on March 24, was assigned to RTX Corp. (Farmington, Conn.).

"Method and apparatus for machine learning based inlet debris monitoring" was invented by Jeremiah C. Lee (Coventry, Conn.), Alek Gavrilovski (Atlanta), Parakrama Herath (Avon, Conn.) and Daniel McMenamin (Ellington, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inlet debris monitoring includes processing circuitry configured to: obtain a data set of electrostatic charge data from an electrostatic sensor; utilize a dimensional reduction technique to obtain a first set of basis vectors that represent the data set in a reduced dimensional space that is reduced with resp...