US Patent Issued to RTX on Jan. 27 for "White light interferometer for measuring radial growth in components experiencing rotating stresses" (Connecticut, Massachusetts Inventors)

ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,312, issued on Jan. 27, was assigned to RTX Corp. (Farmington, Conn.).

"White light interferometer for measuring radial growth in components experiencing rotating stresses" was invented by Dustin Frohnapfel (Hebron, Conn.), Daniel W. Shannon (Glastonbury, Conn.), Robert H. Dold (Monson, Mass.), Christopher T. Chipman (Brooklyn, Conn.), Guthrie G. Bagdonis (Marlborough, Conn.) and John D. Cannata (Marlborough, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus measures clearances between a rotating structure within a fixed surrounding structure. A position detector determines when at least one portion of the rotating structure rotates ...