ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,704,482, issued on Aug. 11, was assigned to RTX Corp. (Farmington, Conn.).
"Resonance inspection system and method for using same" was invented by Ronald B. Coleman (Arlington, Mass.) and Alan R. Curtis (Acton, Mass.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A resonance inspection system a processing system configured to process resonance data including a vibratory response signature of a component over a portion of a frequency range of the vibratory response signature to generate a plurality of different resonance spectra waveforms of the vibratory response signature. The plurality of different resonance spectra waveforms includes a first resonanc...