US Patent Issued to Rohde & Schwarz on Sept. 15 for "Test and/or measurement system" (German Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,569, issued on Sept. 15, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich).

"Test and/or measurement system" was invented by Johannes Steffens (Munich) and Matthias Ruengeler (Munich).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test and/or measurement system includes a signal generator circuit, wherein the signal generator circuit includes a processing circuit. The processing circuit is configured to generate and/or process a predetermined waveform, wherein the predetermined waveform includes at least one critical portion. The processing circuit is configured to control the signal generator circuit to generate a radio frequency, RF, signal...