US Patent Issued to Rockwell Collins on July 14 for "System and method for active electronically scanned array test and calibration" (Iowa Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,681,065, issued on July 14, was assigned to Rockwell Collins Inc. (Cedar Rapids, Iowa).

"System and method for active electronically scanned array test and calibration" was invented by Connor McBryde (Cedar Rapids, Iowa) and James West (Cedar Rapids, Iowa).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test system is presented for validating and calibrating an active electronically scanned array (AESA) with multiple distinct transceiver elements and associated RF channels. The test system includes a static mount for the AESA, and a test probe fixedly located relative to the static mount. The system also includes a network analyzer connected to the AESA...