ALEXANDRIA, Va., Sept. 24 -- United States Patent no. 12,743,366, issued on Sept. 22, was assigned to Robert Bosch GmbH (Stuttgart, Germany).
"Test sequence for stop-at-first-fail testing" was invented by Sebastian Bayer (Schoenaich, Germany) and Michel Janus (Kirchentellinsfurt, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method for determining a test sequence. The test sequence defines a sequential order of performing multiple tests on an instance of a product using stop-at-first-fail. One or more test data instances are accessed. A test data instance represents respective outcomes of the respective tests for an instance of the product. Test cost values are accessed repres...