ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,783,892, issued on Nov. 3, was assigned to Robert Bosch GmbH (Germany).
"Latent outlier exposure for anomaly detection" was invented by Maja Rudolph (Madison, Wis.) and Chen Qiu (Sindelfingen, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "A device control system includes a controller. The controller may be configured to, receive a data set of N samples that includes normal and unlabeled unidentified anomalous data samples, process, via a model, the data set to produce an anomaly score associated with each sample in the data set, rank the normal and anomalous data samples according to the anomaly score associated with each data sample to produce ...