US Patent Issued to RISCURE BEHEER on May 12 for "Side channel leakage source identification in an electronic circuit design" (American, Dutch Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,626,042, issued on May 12, was assigned to RISCURE BEHEER B.V. (Delft, Netherlands).

"Side channel leakage source identification in an electronic circuit design" was invented by Yao Yuan (Blacksburg, Va.), Baris Ege (Delft, Netherlands), Robert Patrick Schaumont (Blacksburg, Va.) and Tarun Kathuria (San Diego).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of identifying, in a circuit design of an electronic circuit, a source of side channel leakage of the electronic circuit. The method comprises: a) simulating over a leakage time interval an operation of the circuit in response to at least one stimulus, thereby deriving for each one of the at le...