ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,523,938, issued on Jan. 13, was assigned to RESEARCH COOPERATION FOUNDATION OF YEUNGNAM UNIVERSITY (Gyeongsangbuk-do, South Korea) and POSTECH Research and Business Development Foundation (Gyeongsangbuk-do, South Korea).

"Method for setting of semiconductor manufacturing parameter and computing device for executing the method" was invented by Hyun Chul Choi (Gyeongsangbuk-do, South Korea), Rock Hyun Baek (Gyeongsangbuk-do, South Korea), Jun Sik Yoon (Gyeongsangbuk-do, South Korea) and Hyeok Yun (Gyeongsangbuk-do, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for setting of a semiconductor manufacturing parameter according to an emb...