US Patent Issued to Renesas Electronics on July 28 for "Semiconductor device, method of testing the same, and method of designing the same" (Japanese Inventor)

ALEXANDRIA, Va., July 28 -- United States Patent no. 12,696,732, issued on July 28, was assigned to Renesas Electronics Corp. (Tokyo).

"Semiconductor device, method of testing the same, and method of designing the same" was invented by Hiroko Yoshinaga (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Signal delay, etc. in a signal path from an electrode pad to a functional block is reduced. An input-output block A and an input-output block B are connected to electrode pads. A functional block A is connected to the electrode pads via the input-output block A. A functional block B is connected to the electrode pads via the input-output block B. The functional block A and the functional block B are arrange...