US Patent Issued to REALTEK SEMICONDUCTOR on Sept. 2 for "Method for determining coefficients of deblur filter" (Taiwanese Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,406,491, issued on Sept. 2, was assigned to REALTEK SEMICONDUCTOR Corp. (Hsinchu, Taiwan).

"Method for determining coefficients of deblur filter" was invented by Shian-Shin Lu (Hsinchu, Taiwan), Tsung-Hsuan Li (Hsinchu, Taiwan) and Shih-Tse Chen (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for determining deblur filter coefficients includes the following steps: generating an edge profile according to the data of a blurred image; estimating a blur kernel according to the edge profile, wherein the blur kernel indicates how an imaging process blurs original image data and thereby generates blurred image data; and determining coe...